Scanning Electron Microscope

Location: Bronfman Science Room 153 Contact: Nancy Piatczyc

The SEM uses a focused electron beam to obtain very high resolution 3 dimensional images of the surface topography of virtually any sample that will fit into the scope. In addition, we can use the SEM to obtain information about the elemental composition of a sample.

The electron microscopes and other scopes are located in the Oberndorf Family Microscopy Suite on the ground floor of Hopper Science Center – Rooms G 08 thru G13.